Characterisation and Control of Defects in Semiconductors - Materials, Circuits and Devices - - Bøger - Institution of Engineering and Technolog - 9781785616556 - 16. december 2019
Ved uoverensstemmelse mellem cover og titel gælder titel

Characterisation and Control of Defects in Semiconductors - Materials, Circuits and Devices

Pris
S$ 255

Bestilles fra fjernlager

Forventes klar til forsendelse 2. - 9. jul.

Vores kunder siger:

14 dages fuld returret
Topvurdering på Trustpilot
Tilføj til din iMusic ønskeseddel

Characterisation and Control of Defects in Semiconductors - Materials, Circuits and Devices

This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.

596 pages

Medie Bøger     Hardcover bog   (Bog med hård ryg og stift omslag)
Udgivet 16. december 2019
ISBN13 9781785616556
Forlag Institution of Engineering and Technolog
Antal sider 596
Mål 1,09 kg
Klipper/redaktør Tuomisto, Filip (Professor, University of Helsinki, Department of Physics, Finland)