Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) - Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland) - Bøger - Imperial College Press - 9781783265282 - 18. maj 2015
Ved uoverensstemmelse mellem cover og titel gælder titel

Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) 2. udgave

Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland)

Pris
NOK 1.549

Bestilles fra fjernlager

Forventes klar til forsendelse 26. jun. - 3. jul.

Vores kunder siger:

14 dages fuld returret
Topvurdering på Trustpilot
Tilføj til din iMusic ønskeseddel

Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition) 2. udgave

Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences.

350 pages

Medie Bøger     Hardcover bog   (Bog med hård ryg og stift omslag)
Udgivet 18. maj 2015
ISBN13 9781783265282
Forlag Imperial College Press
Antal sider 432
Mål 160 × 238 × 23 mm   ·   802 g
Sprog Engelsk  

Se alt med Erni, Rolf (Swiss Federal Labs For Materials Science & Technology (Empa), Switzerland) ( f.eks. Hardcover bog )