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Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices
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Test and Diagnosis of Analogue, Mixed-signal and Rf Integrated Circuits: the System on Chip Approach - Materials, Circuits and Devices
This book provides a comprehensive discussion of automatic testing, diagnosis and tuning of analogue, mixed-signal and RF integrated circuits, and systems in a single source. The book reports systematically the state of the arts and future research directions of those areas.
408 pages, Illustrations
Medie | Bøger Paperback Bog (Bog med blødt omslag og limet ryg) |
Udgivet | 30. maj 2008 |
ISBN13 | 9780863417450 |
Forlag | Institution of Engineering and Technolog |
Antal sider | 408 |
Mål | 159 × 232 × 23 mm · 612 g |
Klipper/redaktør | Sun, Yichuang |