Reliability and Failure of Electronic Materials and Devices - Ohring, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired)) - Bøger - Elsevier Science Publishing Co Inc - 9780120885749 - 1. december 2014
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Reliability and Failure of Electronic Materials and Devices 2. udgave

Ohring, Milton (Stevens Institute of Technology, Hoboken, NJ, USA (Retired))

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Reliability and Failure of Electronic Materials and Devices 2. udgave

Offers coverage of some of the major topics related to the performance and failure of materials used in electronic devices and electronics packaging. This book explains the common mechanisms that lead to electronics materials failures, including dielectric breakdown, hot-electron effects and radiation damage.

758 pages, colour illustrations

Medie Bøger     Hardcover bog   (Bog med hård ryg og stift omslag)
Udgivet 1. december 2014
ISBN13 9780120885749
Forlag Elsevier Science Publishing Co Inc
Antal sider 758
Mål 165 × 232 × 46 mm   ·   1,17 kg
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